• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Process and apparatus for measurement of brightness of milled products, especially flour, are disclosed. The process is of the general type in which the surface of a layer of flour is illuminated, and the returned quantity of light is taken to an optical electrical transducer. A light source is used for illumination, and the light beam is optically decomposed into at least two part-beams (reference beam and measurement beam) for transmission to the transducer. At least one of the part-beams is cyclicly interrupted or broken into two essentially time-shifted measurement phases in such a way that of the two part-beams, only one of the two-part beams will strike the transducer during a first measurement phase, and during a second measurement phase at least the other part-beam will be applied to the transducer. The output signals of the transducer are taken to a memory which intermediately stores the output signals of one measurement phase until the output signals of the following measurement phase appear, so that both output signals can be taken simultaneously to an evaluating device for determination of the relative brightness value of the measurement beam in comparison to the reference beam.
    公开号:SU938754A3
    申请号:SU792822454
    申请日:1979-09-28
    公开日:1982-06-23
    发明作者:Куммер Эмануель
    申请人:Гербюдер Бюлер Аг(Фирма)；
    IPC主号:
    专利说明:

    (5) METHOD FOR DETERMINATION OF LIGHTNESS INDICATOR
    one
    The invention relates to the milling industry and may find application in determining the quality of flour by its lightness.
    A known method for determining the lightness index of the flour involves forming reference and measuring light fluxes, followed by recording the values of the reference and measuring light fluxes and determining the value of the lightness index of the flour by comparing the reference and measuring light fluxes 1.
    However, the known method does not allow determining the lightness index of the flour with sufficient accuracy.
    The aim of the invention is to improve the accuracy.
    The goal is achieved by the fact that when implementing the method for determining the lightness index of the flour, which involves the formation of reference and measuring light fluxes, the irradiation of a sample of a product measuring device MUKI
    luminous flux with the subsequent registration of the values of the reference and. luminous fluxes and the determination of the value of the indicator 5 lightness of flour by comparing
    reference and measuring luminous fluxes, the measuring luminous flux at registration is periodically interrupted, and
    10 lightness is performed by comparing the set value of the lightness index of the flour with the value of the reference luminous flux.
    FIG. 1 schematically depicted
    15 an apparatus for carrying out the method; in fig. 2 is a diagram of signals at various points of the device.
    The device for measuring the lightness of the flour is equipped with a light source 1, a collecting lens 2, a translucent mirror 3, a focusing lens C, a chopper 5, a photocell 6, a photoelectric monitoring device. 7 and a control circuit comprising an amplifier 8 connected via a switch 9 to the first and second intermediate blocks 10 and 11 of memory, respectively, adder 12, block 13 of calculation and block C of the task.
    At the same time, the interrupter 5 is made in the form of a half cylinder with the possibility of rotation.
    The method is carried out as follows.
    The light flux focused by the collecting lens 2 from the light source 1 falls on the semi-transparent mirror 3, where it is divided into a reference one, reflecting from the semi-transparent mirror and falling directly onto the photocell 6, and measuring, passing through the semi-transparent mirror and falling on the flour surface analyzed, closed glass plate, reflected from which and focused by the lens C falls on the photocell 6, herewith, depending on the position of the interrupter driven by the actuator (not shown ) Izmepitelny light flux reflected from the analyzed surface and focused by a lens, hits the solar cell periodically while as the reference luminous flux acts on a photocell permanently.
    The output of the photocell 6 is connected to the input of the amplifier 8, the output of which is connected to the switch 9 of the control input of the latter connected to a photoelectric test device.7, which is placed at an angle of 180 to the measuring beam and, depending on the position of the interrupter, supplies or stops the control pulse at the time of the phase T switch, the measuring light flux is interrupted by the cylindrical wall of the chopper, and only the reference light flux, which is amplified and fed to switch.
    After turning the chopper 180, when the wall during the T phase of the latter passes the measuring luminous flux, the latter hits the photocell, amplifies by the value corresponding to the measuring luminous flux, and maintains this value for the entire duration of phase I. After one more turn 180
    output breaker on
    the photocell falls off as the chopper wall again blocks the measuring luminous flux (curve A of the signals at the input of the switch 9 in FIG. 2).
    The signal S formed during phase b corresponds to the reference luminous flux S | while the signal formed during phase Td corresponds to the sum of the values of the reference luminous flux S and the measured luminous flux 5c.
    The photoelectric monitoring device 7 switches on the switch 9 with the phase T to the first intermediate memory block 10 and during the second phase T to the second intermediate memory block 11. At the output of the first intermediate memory block 10, a signal O appears, which is stored there and
    during the second phase T of the measurement, although Sji appears at the output of amplifier B. At the output of the second intermediate memory block 11 during the same period of time, the signal Sj. Is applied. Therefore, during the second phase 12 of the measurement, signals Si and $ 2 appear at the input of the adder 12. At the output of the adder 12 there appears the signal S is equal to the signal j, the signals of the signals S and $ 2, which is then fed to the input of the calculating unit 13, the second input of which is connected to the output of the second intermediate memory block 11, producing a signal Sj equal to the value of the reference light flux
    In block 13 of the calculation, the values of the measuring luminous flux are divided by the reference and the multiplication of the obtained values by a constant coefficient K, the value of the latter arrives at block 13 of the calculation from the block} C task. The resulting value corresponds to the indicator of the lightness of the flour, which characterizes its quality.
    Fluctuations in the brightness of the light source 1 or photocell oscillations take into account the coefficient K.
    To bring all elements of the circuit to the initial state, in particular the intermediate memory blocks 10 and 11 of the adder 12 and the computing unit 13, synchronization and control elements that are not shown in the drawings are provided, which, after the end of the individual measurement phases
    T or T. start up or nullify the structural elements of the circuit to conduct a new measurement phase.
    权利要求:
    Claims (1)
    [1]
    1. For the application of the Federal Republic of Germany No. 1527706, cl. C2 h 17/02, 1967.
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    类似技术:
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    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    WO1992006374A1|1990-09-18|1992-04-16|Moskovsky Tekhnologichesky Institut Pischevoi Promyshlennosti|Method for laboratory test baking of wheat bread|US2709751A|1951-01-17|1955-05-31|Foxboro Co|Infrared concentrometer|
    GB873563A|1959-01-13|1961-07-26|Thomson Houston Comp Francaise|Improvements relating to photometric apparatus|
    NL297370A|1962-08-31|1900-01-01|
    US3488122A|1965-01-25|1970-01-06|Oreal|Process for determining the spectral composition of luminous radiation diffused by a colored surface,and apparatus for carrying out said process|
    US3446972A|1966-07-18|1969-05-27|Kollmorgen Corp|Automatic gain control for photomultiplier tubes employing a monitoring photocell|
    US3684378A|1970-09-04|1972-08-15|Joseph S Lord|Dark current correction circuit for photosensing devices|
    NL7210356A|1971-08-06|1973-02-08|
    GB1356049A|1971-12-21|1974-06-12|Fortschritt Veb K|Reflectance comparator|US4529308A|1982-05-28|1985-07-16|Hunter Associates Laboratory, Inc.|Spectrophotometer apparatus and method including scale drift correction feature|
    US4742228A|1984-04-19|1988-05-03|Gebruder Buhler Ag|Infrared measuring apparatus and process for the continuous quantitative determination of individual components of flour or other groundable food products|
    JPH01253634A|1988-04-01|1989-10-09|Fuji Photo Film Co Ltd|Reflection density measuring apparatus|
    FI901257A|1990-03-14|1991-09-15|Outokumpu Oy|MAETCELL.|
    US6836325B2|1999-07-16|2004-12-28|Textron Systems Corporation|Optical probes and methods for spectral analysis|
    US6424416B1|1999-10-25|2002-07-23|Textron Systems Corporation|Integrated optics probe for spectral analysis|
    US6418805B1|1999-11-18|2002-07-16|Textron Systems Corporation|Constituent sensing system|
    EP1264170B1|2000-03-10|2009-02-04|Textron Systems Corporation|Optical probes and methods for spectral analysis|
    US6507403B1|2001-07-16|2003-01-14|Honeywell International Inc.|Gloss sensor having dirt buildup compensation apparatus and method|
    EP3213053B1|2014-12-23|2019-08-28|Apple Inc.|Optical inspection system and method including accounting for variations of optical path length within a sample|
    US10718931B2|2014-12-23|2020-07-21|Apple Inc.|Confocal inspection system having averaged illumination and averaged collection paths|
    KR102272877B1|2016-04-21|2021-07-05|애플 인크.|Optical system for reference switching|
    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    CH1018978|1978-09-29|
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